| 1. | Cable depth profile indicating cable depth of each cable
显示每条地下电缆深度的资料； |
| 2. | Sims measuring widths of interfaces in sputter depth profiling using sims
用次级离子质谱法 |
| 3. | Standard guide for depth profiling auger electron spectroscopy
俄歇电子能谱术深度剖析标准导则 |
| 4. | Standard guide for depth profiling in auger electron spectroscopy
螺旋电子光谱法的深度剖面的标准指南 |
| 5. | Depth profiling analysis by d p coincidence technique a preliminary result
符合技术进行深度分布分析初探 |
| 6. | Surface chemical analysis . depth profiling . measurement of sputtered depth
表面化学分析.深度剖面.溅涂深度的测量 |
| 7. | Surface chemical analysis - depth profiling - measurement of sputtered depth
表面化学分析.深度剖面.溅蚀深度的测量 |
| 8. | Investigation of ion depth profile in silicon implanted by focused ion beam
聚焦离子束无掩膜注入单晶硅离子浓度浓度分布的研究 |
| 9. | Surface chemical analysis - secondary - ion mass spectrometry - method for depth profiling of boron in silicon
表面化学分析.再生离子质量光谱测定.硅中硼的深仿形分析法 |
| 10. | Surface chemical analysis - sputter depth profiling - optimization using layered systems as reference materials
表面化学分析.溅镀深度造型.利用分层系统作为标准物质的优选法 |
